TEST PIN
TEST PIN delivering signals or data between chip and P.C.B is AWESOME bridge which is suitable for high-density semiconductor testing.
Our products ensure stability, reliability with excellent signal transmission performance and high durability.
TEST PIN supports accurate data acquisition rapidly during test process and contributes to satisfying various test requirements.
Palladium Alloy
Date
TOP PLUNGER :PD Alloy
BOTTOM PLUNGER :Hardened beryllium copper / GOLD PLATED
BARREL :Phosphor Bronze / GOLD PLATED
SPRING :Music Wire / GOLD PLATED
Recommended travel :30g at 0.30mm
Full travel :0.35mm
추가내용 :[{"title":"","content":"Mirror Cut for Crown Tip"},{"title":"","content":"Durable Gold plating : 30% improved life span than general Gold plating"},{"title":"","content":"Electroforming pipe : Ni-Au Alloy"},{"title":"","content":"Hard PD Alloy : HV>500"},{"title":"","content":"Extreme Temperature : -60℃~220℃"}]